The minimum detection limit for XRF depends on several factors, including the concentration of the element in the sample, the type of sample being analyzed, and the XRF spectrometer being used.
For most elements, XRF can detect concentrations as low as 2-20 ng/cm2. This means that it can detect very small amounts of elements in a sample.
The detection limit can vary depending on the type of sample. For example, food samples may have a lower detection limit of 2-4 tons, while pharmaceutical products may require a higher detection limit of 20 tons. Mineral ores may have an even higher detection limit of up to 40 tons.
The detection limit can also depend on the sample preparation technique used. For example, the fused bead XRF technique, which involves grinding the sample to a fine particle size and compressing it into a smooth and flat pellet, can improve the detection of emissions. However, this technique may not be able to detect trace elements as the sample needs to be diluted.
The depth at which XRF can detect elements in a sample also depends on the atomic weight of the element. Lighter elements are harder to detect than heavier elements, and the depth of detection generally ranges from 1-1000 µm below the sample's surface.
The type of XRF spectrometer used can also affect the detection limit. Energy Dispersive XRF (ED-XRF) spectrometers are simple and easy to use, but may have a lower resolution, while Wavelength Dispersive XRF (WD-XRF) spectrometers are more complex and expensive, but offer higher resolution.
In summary, the minimum detection limit for XRF depends on the concentration of the element, the type of sample, the sample preparation technique, the atomic weight of the element, and the type of XRF spectrometer being used.
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