The minimum sample required for XRD (X-ray Diffraction) analysis is not explicitly mentioned in the provided text, which primarily discusses XRF (X-ray Fluorescence) analysis. However, for XRD analysis, the sample preparation and quantity requirements can be inferred from general practices in material analysis. Typically, for XRD, a small amount of sample, often around 10-20 mg, is sufficient if the sample is finely ground and homogeneously distributed on a sample holder. The key requirement for XRD is that the sample must be in a form that allows the X-rays to penetrate and interact with the crystalline structure of the material, which is why a thin, flat layer of the sample is often prepared.
For XRD, the sample preparation involves grinding the material to a fine powder to ensure that the crystalline structure is well-represented and that the X-rays can interact with a large number of crystallites. This grinding process is crucial to achieve a homogeneous sample, which is essential for accurate and reproducible XRD patterns. The powder is then spread onto a glass slide or a sample holder, ensuring that it is evenly distributed and compacted to minimize preferred orientation and thickness variations.
In summary, while the specific quantity of 15g mentioned in the text is for XRF analysis, for XRD, a much smaller amount, typically around 10-20 mg of finely ground and homogeneously prepared sample, is sufficient. The preparation method ensures that the sample is in a form that allows for effective interaction with the X-ray beam, which is critical for obtaining clear and interpretable diffraction patterns.
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