XRF (X-ray Fluorescence) analysis typically penetrates the sample to depths between 1-1000 µm. The penetration depth is influenced by the atomic weight of the elements in the sample; lighter elements are harder to detect at deeper levels compared to heavier elements. This is because the characteristic X-rays emitted during the analysis are generally due to surface atoms at these depths. The ability to detect elements at different depths is crucial for accurate analysis, as it affects the signal received by the XRF spectrometer. Higher energy elements, typically those with higher atomic numbers, have deeper escape depths in a sample, meaning they can be detected from deeper layers compared to lower energy elements. This depth sensitivity is a key factor in the preparation and interpretation of XRF analysis results.
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