Knowledge How do you measure thin film SEM thickness? 5 Key Steps to Know
Author avatar

Tech Team · Kintek Solution

Updated 1 month ago

How do you measure thin film SEM thickness? 5 Key Steps to Know

Measuring the thickness of thin films using scanning electron microscopy (SEM) is a crucial process, especially in industries like semiconductors.

SEM allows for not only measuring the thickness but also providing insights into the surface morphology and elemental composition of the film.

This method is particularly effective for semiconducting thin films with thicknesses ranging from 100 nm to 100 μm.

5 Key Steps to Know

How do you measure thin film SEM thickness? 5 Key Steps to Know

1. Cross-sectional SEM Analysis

The first step in measuring thin film thickness with SEM is to prepare a cross-sectional sample.

This involves cutting the sample in a way that exposes a clean and clear cross-section of the thin film.

The sample is then mounted on a stub and coated with a thin layer of conductive material, usually gold or platinum, to prevent charging during the SEM imaging process.

2. Imaging and Measurement

Once prepared, the sample is imaged using the SEM.

The electron beam scans across the surface of the sample, and the interactions between the electrons and the sample generate signals that provide information about the sample's surface topography, composition, and other characteristics.

For thickness measurement, the cross-sectional view is critical as it allows direct visualization of the film's thickness.

The thickness can be measured directly from the SEM images by analyzing the distance between the top surface of the film and the substrate.

3. Accuracy and Considerations

The accuracy of the thickness measurement depends on the resolution of the SEM and the quality of the sample preparation.

High-resolution SEM can provide measurements with nanometer precision.

However, it is important to note that the composition and structure of the sample must be known to ensure accurate analysis.

If the composition is unknown, it can lead to errors in the thickness measurement.

4. Benefits and Limitations

The primary benefit of using SEM for thickness measurement is its ability to provide detailed information about the film's morphology and composition in addition to the thickness.

This makes it a valuable tool for comprehensive thin film analysis.

However, the method is limited by the need for careful sample preparation and the requirement for a cross-sectional view, which may not always be feasible or practical.

5. Summary

In summary, SEM is a powerful technique for measuring the thickness of thin films, especially in the semiconductor industry.

It offers high precision and additional information about the film's properties, making it a preferred choice for many applications.

However, the method requires careful sample preparation and knowledge of the film's composition for accurate results.

Continue exploring, consult our experts

Experience cutting-edge thin film analysis with KINTEK SOLUTION's advanced SEM solutions!

Our precision instruments not only measure film thickness with unparalleled accuracy, from 100 nm to 100 μm, but also reveal the intricate details of surface morphology and elemental composition.

Unlock the full potential of your materials with our comprehensive SEM services and witness how our state-of-the-art technology enhances your research and development endeavors.

Partner with KINTEK SOLUTION today and elevate your thin film analysis to new heights!

Related Products

No demolding lab infrared press mold

No demolding lab infrared press mold

Effortlessly test your samples with no demolding required using our lab infrared press mold. Enjoy high transmittance and customizable sizes for your convenience.

Plasma enhanced evaporation deposition PECVD coating machine

Plasma enhanced evaporation deposition PECVD coating machine

Upgrade your coating process with PECVD coating equipment. Ideal for LED, power semiconductors, MEMS and more. Deposits high-quality solid films at low temps.

Thin-layer spectral electrolysis cell

Thin-layer spectral electrolysis cell

Discover the benefits of our thin-layer spectral electrolysis cell. Corrosion-resistant, complete specifications, and customizable for your needs.

lab infrared press mold

lab infrared press mold

Easily release samples from our lab infrared press mold for accurate testing. Ideal for battery, cement, ceramics, and other sample preparation research. Customizable sizes available.

XRF & KBR steel ring lab Powder Pellet Pressing Mold

XRF & KBR steel ring lab Powder Pellet Pressing Mold

Produce perfect XRF samples with our steel ring lab powder pellet pressing mold. Fast tableting speed and customizable sizes for accurate molding every time.

Automatic Lab XRF & KBR Pellet Press 30T / 40T / 60T

Automatic Lab XRF & KBR Pellet Press 30T / 40T / 60T

Fast and easy xrf sample pellet preparation with KinTek Automatic Lab Pellet Press. Versatile and accurate results for X-ray fluorescence analysis.

RF PECVD System Radio Frequency Plasma-Enhanced Chemical Vapor Deposition

RF PECVD System Radio Frequency Plasma-Enhanced Chemical Vapor Deposition

RF-PECVD is an acronym for "Radio Frequency Plasma-Enhanced Chemical Vapor Deposition." It deposits DLC (Diamond-like carbon film) on germanium and silicon substrates. It is utilized in the 3-12um infrared wavelength range.

Electron Beam Evaporation Coating Tungsten Crucible / Molybdenum Crucible

Electron Beam Evaporation Coating Tungsten Crucible / Molybdenum Crucible

Tungsten and molybdenum crucibles are commonly used in electron beam evaporation processes due to their excellent thermal and mechanical properties.

Infrared Silicon / High Resistance Silicon / Single Crystal Silicon Lens

Infrared Silicon / High Resistance Silicon / Single Crystal Silicon Lens

Silicon (Si) is widely regarded as one of the most durable mineral and optical materials for applications in the near-infrared (NIR) range, approximately 1 μm to 6 μm.

Carbon paper for batteries

Carbon paper for batteries

Thin proton exchange membrane with low resistivity; high proton conductivity; low hydrogen permeation current density; long life; suitable for electrolyte separators in hydrogen fuel cells and electrochemical sensors.

CVD Diamond coating

CVD Diamond coating

CVD Diamond Coating: Superior Thermal Conductivity, Crystal Quality, and Adhesion for Cutting Tools, Friction, and Acoustic Applications

Zinc sulfide (ZnS) window

Zinc sulfide (ZnS) window

Optics Zinc Sulphide (ZnS) Windows have an excellent IR transmission range between 8-14 microns.Excellent mechanical strength and chemical inertness for harsh environments (harder than ZnSe Windows)

Platinum disc electrode

Platinum disc electrode

Upgrade your electrochemical experiments with our Platinum Disc Electrode. High-quality and reliable for accurate results.

Gold sheet electrode

Gold sheet electrode

Discover high-quality gold sheet electrodes for safe and durable electrochemical experiments. Choose from complete models or customize to meet your specific needs.

Infrared transmission coating sapphire sheet / sapphire substrate / sapphire window

Infrared transmission coating sapphire sheet / sapphire substrate / sapphire window

Crafted from sapphire, the substrate boasts unparalleled chemical, optical, and physical properties. Its remarkable resistance to thermal shocks, high temperatures, sand erosion, and water sets it apart.

Electron Beam Evaporation Graphite Crucible

Electron Beam Evaporation Graphite Crucible

A technology mainly used in the field of power electronics. It is a graphite film made of carbon source material by material deposition using electron beam technology.


Leave Your Message